Test of SiC-electrodes in a high current pseudospark switch

Author

Gortler, A. ; Schwandner, A. ; Frank, K. ; Christiansen, J. ; Hoffmann, D.H.H.

Author_Institution

Dept. of Phys., Erlangen-Nurnberg Univ., Germany

fYear

1995

fDate

5-8 June 1995

Firstpage

292

Abstract

Summary form only given. The electrode erosion is a limiting factor in the lifetime of pseudospark switches. Mainly in high current applications (30 kA \n\n\t\t

Keywords

electrodes; flashover; glow discharges; plasma collision processes; plasma devices; plasma sheaths; plasma switches; plasma-wall interactions; semiconductor materials; silicon compounds; sparks; surface discharges; switches; wear; 1 to 20 mus; 30 to 400 kA; BC; SiC; SiC-electrodes; cathode spot generation; cathode surface sheath; conditioning phase; discharge current; electrode erosion; heating; high current applications; high current pseudospark switch; hollow cathode; hollow cathode discharge; ion bombardment; limiting factor; low pressure gas discharge; misfiring; power loss; pre-firing; pseudospark discharge; surface flashover; temperature-resistance dependence; Cathodes; Electrodes; Flashover; Resistance heating; Semiconductor materials; Silicon carbide; Surface discharges; Surface resistance; Switches; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on

Conference_Location

Madison, WI, USA

ISSN

0730-9244

Print_ISBN

0-7803-2669-5

Type

conf

DOI

10.1109/PLASMA.1995.533550

Filename

533550