• DocumentCode
    2431626
  • Title

    Optimizing metalization patterns for yearly yield [solar cell fabrication]

  • Author

    Burgers, A.R. ; Eikelboom, J.A.

  • Author_Institution
    Energy Res. Found., Petten, Netherlands
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    219
  • Lastpage
    222
  • Abstract
    Normally solar cells are optimized for maximum efficiency at standard test conditions. It is recognized ever more widely that cells and modules should be optimized for maximum yield at their operating conditions. The metalization pattern is one aspect of this optimization. An optimized pattern can be implemented at no cost in, for instance, the case of screen-printed solar cells, as it merely requires changing the screen printing mask. The authors demonstrate that most H-grid metalization programs can be used without any modification for optimization for yearly yield. They then use this method to optimize for both yearly yield for irradiation conditions as they occur in the Netherlands and standard test conditions. It turns out that we arrive for yearly optimization at fewer busbars and a much lower number of fingers. The total yield is improved by 1%
  • Keywords
    optimisation; semiconductor device metallisation; semiconductor device models; solar cells; H-grid metallisation programmes; Netherlands; busbars; irradiation conditions; metallisation patterns optimisation; operating conditions; screen-printed solar cells; solar cell fabrication; standard test conditions; yearly yield optimisation; Bars; Cost function; Fingers; Lighting; Optimization methods; Photovoltaic cells; Power supplies; Printing; Soldering; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654068
  • Filename
    654068