DocumentCode
2431626
Title
Optimizing metalization patterns for yearly yield [solar cell fabrication]
Author
Burgers, A.R. ; Eikelboom, J.A.
Author_Institution
Energy Res. Found., Petten, Netherlands
fYear
1997
fDate
29 Sep-3 Oct 1997
Firstpage
219
Lastpage
222
Abstract
Normally solar cells are optimized for maximum efficiency at standard test conditions. It is recognized ever more widely that cells and modules should be optimized for maximum yield at their operating conditions. The metalization pattern is one aspect of this optimization. An optimized pattern can be implemented at no cost in, for instance, the case of screen-printed solar cells, as it merely requires changing the screen printing mask. The authors demonstrate that most H-grid metalization programs can be used without any modification for optimization for yearly yield. They then use this method to optimize for both yearly yield for irradiation conditions as they occur in the Netherlands and standard test conditions. It turns out that we arrive for yearly optimization at fewer busbars and a much lower number of fingers. The total yield is improved by 1%
Keywords
optimisation; semiconductor device metallisation; semiconductor device models; solar cells; H-grid metallisation programmes; Netherlands; busbars; irradiation conditions; metallisation patterns optimisation; operating conditions; screen-printed solar cells; solar cell fabrication; standard test conditions; yearly yield optimisation; Bars; Cost function; Fingers; Lighting; Optimization methods; Photovoltaic cells; Power supplies; Printing; Soldering; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location
Anaheim, CA
ISSN
0160-8371
Print_ISBN
0-7803-3767-0
Type
conf
DOI
10.1109/PVSC.1997.654068
Filename
654068
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