• DocumentCode
    2431709
  • Title

    Film Bulk Acoustic-wave Resonator (FBAR) based humidity sensor

  • Author

    Qiu, Xiaotun ; Zhu, Jie ; Oiler, Jon ; Yu, Cunjiang ; Wang, Ziyu ; Yu, Hongyu

  • Author_Institution
    Sch. of Electr., Comput. & Energy Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2010
  • fDate
    20-23 Jan. 2010
  • Firstpage
    445
  • Lastpage
    449
  • Abstract
    This paper described relative humidity (RH) sensing with ZnO based Film Bulk Acoustic-wave Resonator (FBAR). The resonant frequency of the FBAR decreased in a two-stage manner as the RH increased in the environment. For low RH (RH<;;50%), a frequency shift of 2.2 kHz per 1% RH change was observed. This effect was attributed to water molecules replacing the adsorbed oxygen on the ZnO surface, thus increasing the density of the film. While for high RH (RH>50%), a frequency shift of 8.5 kHz per 1% RH change was obtained, which was due to the mass loading effect of the water layers formed on the ZnO surface. Ultraviolet (UV) light was applied to monitor its effects on the humidity sensing performance of the FBAR. UV can enhance the sensitivity at low RH (response increased to 3.4 kHz per 1 % RH change), while degrade the sensitivity at high RH (response decreased to 5.7 kHz per 1% RH change). This study has proven the feasibility of measuring relative humidity using ZnO film based FBAR.
  • Keywords
    acoustic resonators; bulk acoustic wave devices; humidity sensors; water; FBAR resonant frequency; RH sensing; UV light; ZnO; adsorbed oxygen; film bulk acoustic wave resonator; frequency 2.2 kHz; frequency 8.5 kHz; frequency shift; mass loading effect; relative humidity sensing; ultraviolet light; water molecules; Film bulk acoustic-wave resonator; frequency shift; relative humidity; ultraviolet;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6543-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2010.5592429
  • Filename
    5592429