• DocumentCode
    2431816
  • Title

    Effect of additives on mechanical properties of electroplating nickel

  • Author

    Tang, Jun ; Mao, Shengping ; Wang, Hong ; Liu, Rui ; Ding, Guifu

  • Author_Institution
    Key Lab. for Thin Film & Microfabrication Technol. of Minist. of Educ., Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2010
  • fDate
    20-23 Jan. 2010
  • Firstpage
    450
  • Lastpage
    453
  • Abstract
    Since the additives is necessary for eliminating the residual stress of the nickel structure in MEMS devices, the effect of additives on mechanical properties of electroplating nickel was studied in this paper. Two types of nickel specimens was electroplated in electrolytes with both saccharine and butynediol (type A), and only saccharine (type B), respectively. The test chips were then tested in our tensile system. The average ultimate tensile strength and hardness of type A and type B specimens are 1954MPa and 4.47GPa, 923Mpa and 2.87GPa, respectively; the average elongation of type A, and type B are 7.94% and 12.38%, respectively, when the gauge length is 100μm. The mean grain sizes of type A and type B specimens are about 20nm, 160nm. The results indicates that nickel film fabricated in an electrolyte added by both saccharine and butynediol leads to much more smooth surface, finer nano-grain, and higher ultimate tensile strength-1954Mpa, which is two times of that of another type-923Mpa. The SEM images also show differences in fractography of two types. All the results indicate that additives could affect the mechanical properties dramatically, and it is essential for the designer to consider this effect during the MEMS devices designing process.
  • Keywords
    additives; electrolytes; electroplating; fractography; grain size; mechanical properties; nickel alloys; additives; electrolyte; electroplating nickel; fractography; grain sizes; mechanical properties; additives; electroplating; mechanical properties; nickel; tensile test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6543-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2010.5592433
  • Filename
    5592433