A fast algorithm for the study of wave-packet scattering at disordered interfaces

Author

Barker, J.R. ; Watling, J.R. ; Wilkins, R.

Author_Institution

Dept. of Electron. & Electr. Eng., Glasgow Univ., UK

fYear

2000

fDate

22-25 May 2000

Firstpage

75

Lastpage

76

Abstract

We describe a very efficient algorithm for determining the scattering of wave-packets in 2D and 3D off a rough interface. The immediate objective is to derive effective scattering rates for utilisation in Monte Carlo simulation of MOSFET devices. Our methodology involves solving the multi-dimensional time-dependent Schrodinger equation, based on two-time iteration and direct integration.

Keywords

MOSFET; Monte Carlo methods; Schrodinger equation; integration; interface roughness; iterative methods; semiconductor device models; MOSFET devices; Monte Carlo simulation; direct integration; disordered interfaces; effective scattering rates; fast algorithm; multi-dimensional time-dependent Schrodinger equation; rough interface; two-time iteration; very efficient algorithm; wave-packet scattering; Finite difference methods; Germanium silicon alloys; MOSFET circuits; Rough surfaces; Scattering; Schrodinger equation; Semiconductor process modeling; Silicon germanium; Stability analysis; Surface roughness;

fLanguage

English

Publisher

ieee

Conference_Titel

Computational Electronics, 2000. Book of Abstracts. IWCE Glasgow 2000. 7th International Workshop on

Conference_Location

Glasgow, UK

Print_ISBN

0-85261-704-6

Type

conf

DOI

10.1109/IWCE.2000.869930

Filename

869930