• DocumentCode
    24319
  • Title

    Analog Circuit Design Using Tunnel-FETs

  • Author

    Sedighi, Behnam ; Hu, Xiaobo Sharon ; Huichu Liu ; Nahas, Joseph J. ; Niemier, Michael

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
  • Volume
    62
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    39
  • Lastpage
    48
  • Abstract
    Tunnel-FET (TFET) is a major candidate for beyond-CMOS technologies. In this paper, the properties of the TFETs that affect analog circuit design are studied. To demonstrate how TFETs can enhance the performance or change the topology of the analog circuits, several building blocks such as operational transconductance amplifiers (OTAs), current mirrors, and track-and-hold circuits are examined. It is shown that TFETs are promising for low-power and low-voltage designs, wherein transistors are biased at low-to-moderate current densities. Comparing 14-nm III-V TFET-based OTAs with Si-MOSFET-based designs demonstrates up to 5 times reduction in the power dissipation of the amplifiers and more than an order of magnitude increase in their DC voltage gain. The challenges and opportunities that come with the special characteristics of TFETs, namely asymmetry, ambipolar behavior, negative differential resistance, and superlinear operation are discussed in detail.
  • Keywords
    CMOS integrated circuits; MOSFET; analogue circuits; current density; current mirrors; elemental semiconductors; field effect transistors; network synthesis; operational amplifiers; sample and hold circuits; silicon; tunnel transistors; CMOS technologies; III-V TFET-based OTA; Si; Si-MOSFET-based designs; ambipolar behavior; amplifier power dissipation; analog circuit design; current mirrors; low-to-moderate current densities; negative differential resistance; operational transconductance amplifiers; size 14 nm; superlinear operation; track-and-hold circuits; tunnel-FET; Analog circuits; CMOS integrated circuits; Capacitance; Logic gates; MOSFET; Transconductance; Amplifiers; analog circuits; benchmark testing; nanoscale devices; sampled-data circuits; tunneling devices;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2014.2342371
  • Filename
    6876225