DocumentCode :
2431969
Title :
Record efficiencies above 21% for MIS-contacted diffused junction silicon solar cells
Author :
Metz, Axel ; Hezel, Rudolf
Author_Institution :
Inst. fur Solarenergieforschung HamelnEmmerthal, Germany
fYear :
1997
fDate :
29 Sep-3 Oct 1997
Firstpage :
283
Lastpage :
286
Abstract :
High-efficiency solar cells obtained by a simple cost-effective manufacturing process are required for a drastic reduction of the costs of solar electricity. In this paper, an improved and yet simple processing sequence for highly efficient MIS-contacted diffused n+ p junction (MIS-n+p) silicon solar cells is presented. The process is characterised by: (i) formation of a metal-insulator-semiconductor (MIS) contact on an n+-diffused emitter; (ii) aluminium metallisation for front and rear electrodes; and (iii) low-temperature surface passivation by PECVD silicon nitride. For MIS-n+p solar cells with the front grid defined by Al evaporation through a shadow mask, efficiencies of up to 20.6% have been obtained. Furthermore, mask-free metallised cells with a mechanically grooved front surface have been fabricated. These cells have reached a confirmed efficiency of 21.1%, the highest value to date reported for MIS-n+p silicon solar cells
Keywords :
MIS devices; elemental semiconductors; masks; metallisation; passivation; plasma CVD; plasma CVD coatings; semiconductor device manufacture; semiconductor device testing; silicon; solar cells; 21.1 percent; MIS contact formation; MIS-contacted diffused junction solar cells; MIS-n+p silicon solar cells; PECVD silicon nitride; Si; aluminium metallisation; cost-effective manufacturing process; front electrode; front grid; low-temperature surface passivation; mechanically grooved front surface; n+-diffused emitter; rear electrode; shadow mask; Aluminum; Artificial intelligence; Electrodes; Energy conversion; Fabrication; Lithography; Metallization; Passivation; Photovoltaic cells; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
ISSN :
0160-8371
Print_ISBN :
0-7803-3767-0
Type :
conf
DOI :
10.1109/PVSC.1997.654084
Filename :
654084
Link To Document :
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