Title :
New aspects of phase segregation and junction formation in CulnSe 2
Author :
Herberhotz, R. ; Schock, H.W. ; Rau, U. ; Werner, J.H. ; Haalboom, T. ; Godecke, T. ; Ernst, F. ; Beilharz, C. ; Benz, K.W. ; Cahen, D.
Author_Institution :
Inst. fur Phys. Elektronik, Stuttgart Univ., Germany
fDate :
29 Sep-3 Oct 1997
Abstract :
A reinvestigation of the phase diagram on the quasibinary Cu2 Se-In2Se3 cut reveals a much narrower existence range of the chalcopyrite α-phase as compared to previous phase diagrams towards In- and Ga-rich compositions. The presence of Na or replacement of In by Ga inhibits defect ordering and widens the existence range of the α-phase. Capacitance measurements reveal two types of junction metastabilities in Cu(In,Ga)Se 2 solar cells. An increase of the capacitance after electron injection into the space charge region most likely relates to a local defect reaction. A change of the spatial distribution of charges after annealing under applied bias points to Cu-electromigration. We suggest that the potential determined by a positive surface charge and Cu-migration assist the formation of the Cu-poor (“ODC”) surface. This mechanism also causes distinct differences in the properties of the Cu-poor surface and the bulk β-phase
Keywords :
capacitance; copper compounds; crystal defects; electromigration; gallium compounds; indium compounds; p-n junctions; phase diagrams; segregation; semiconductor thin films; solar cells; space charge; ternary semiconductors; Cu(In,Ga)Se2 solar cells; Cu(InGa)Se2; Cu-electromigration; Cu2Se-In2Se3; CulnSe2; Ga-rich compositions; In-rich compositions; applied bias points; bulk β-phase; capacitance measurements; chalcopyrite α-phase; charge spatial distribution; defect ordering; electron injection; junction formation; junction metastabilities; local defect reaction; phase diagrams; phase segregation; positive surface charge; quasibinary Cu2Se-In2Se3 cut; space charge region; Capacitance measurement; Composite materials; Electrons; Metastasis; Photovoltaic cells; Spectroscopy; Stability; Temperature distribution; Transistors; X-ray diffraction;
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-3767-0
DOI :
10.1109/PVSC.1997.654093