• DocumentCode
    2432245
  • Title

    Step height evaluation in the vibrating condition based on microscopic interferometry

  • Author

    Bian, Yan ; Guo, Tong

  • Author_Institution
    Dept. of Autom. Eng., Tianjin Univ. of Technol. & Educ., Tianjin, China
  • fYear
    2010
  • fDate
    20-23 Jan. 2010
  • Firstpage
    528
  • Lastpage
    531
  • Abstract
    Microscopic interferometry can be applied in the step height evaluation with sub-nanometer vertical resolution. This paper describes the effect of outside vibration on the evaluation process through many experiments. A micro actuator with high accuracy is used as the simulation of outside vibration. Experiments are done on the system with different vibration amplitudes, vibration frequencies and phase extracting algorithms. The experimental results show that different phase extracting algorithms have different responses to the outside vibration; low frequency has a strong effect on the measurement values when the vibration amplitude is below a threshold value; however, the effect on the step height evaluation is small by averaging many profiles.
  • Keywords
    height measurement; image resolution; microactuators; phase shifting interferometry; vibrations; micro actuator; microscopic interferometry; outside vibration effect; phase extracting algorithm; step height evaluation; sub-nanometer vertical resolution; Step height; microscopic interferometry; phase extracting algorithm; vibrating condition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6543-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2010.5592453
  • Filename
    5592453