DocumentCode
2432245
Title
Step height evaluation in the vibrating condition based on microscopic interferometry
Author
Bian, Yan ; Guo, Tong
Author_Institution
Dept. of Autom. Eng., Tianjin Univ. of Technol. & Educ., Tianjin, China
fYear
2010
fDate
20-23 Jan. 2010
Firstpage
528
Lastpage
531
Abstract
Microscopic interferometry can be applied in the step height evaluation with sub-nanometer vertical resolution. This paper describes the effect of outside vibration on the evaluation process through many experiments. A micro actuator with high accuracy is used as the simulation of outside vibration. Experiments are done on the system with different vibration amplitudes, vibration frequencies and phase extracting algorithms. The experimental results show that different phase extracting algorithms have different responses to the outside vibration; low frequency has a strong effect on the measurement values when the vibration amplitude is below a threshold value; however, the effect on the step height evaluation is small by averaging many profiles.
Keywords
height measurement; image resolution; microactuators; phase shifting interferometry; vibrations; micro actuator; microscopic interferometry; outside vibration effect; phase extracting algorithm; step height evaluation; sub-nanometer vertical resolution; Step height; microscopic interferometry; phase extracting algorithm; vibrating condition;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location
Xiamen
Print_ISBN
978-1-4244-6543-9
Type
conf
DOI
10.1109/NEMS.2010.5592453
Filename
5592453
Link To Document