• DocumentCode
    2432531
  • Title

    Effective parameterization for IP re-use

  • Author

    Seng, Francis Chong Khui ; Manaf, Asrulnizam Bin Abd ; Wooi, Lim Han

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. Sains Malaysia, Nibong Tebal, Malaysia
  • fYear
    2011
  • fDate
    28-30 Sept. 2011
  • Firstpage
    139
  • Lastpage
    143
  • Abstract
    The advancement of fabrication technology has doubled the silicon capacity every 18 months. Furthermore, design companies are trying to plug in advance and complex design on a system-on-a-chip (SoC). Yet, the time to implement such a complex design is very long. As a result, this widens the gap between silicon capacity and design productivity. In order to solve the productivity gap problem, this research is introducing a parameterized intellectual property (IP) reuse methodology framework in SoC design. This methodology improves the productivity, design quality and time-to-market of SoC design. The proposed methodology was tested using programmable interval timer (PIT). The results not only show this methodology has successfully reduced the entire IP power consumption and area utilization by 41.74% and 2.42% respectively, but also increase IP´s portability, reusability.
  • Keywords
    industrial property; integrated circuit design; system-on-chip; time to market; IP portability; IP power consumption; PIT; SoC design; design productivity; design quality; fabrication technology; intellectual property; parameterized IP reuse methodology; productivity gap problem; programmable interval timer; silicon capacity; system-on-a-chip design; time-to-market; Hardware design languages; IP networks; Measurement; Power dissipation; Radiation detectors; Registers; System-on-a-chip; IP reuse; SoC; parameterize; reconfiguration; time-to-market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
  • Conference_Location
    Kota Kinabalu
  • Print_ISBN
    978-1-61284-844-0
  • Type

    conf

  • DOI
    10.1109/RSM.2011.6088310
  • Filename
    6088310