• DocumentCode
    2432692
  • Title

    Design and analysis of 1–60GHz, RF CMOS peak detectors for LNA calibration

  • Author

    Jayaraman, Karthik ; Khan, Qadeer A. ; Chiang, Patrick ; Chi, Baoyong

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
  • fYear
    2009
  • fDate
    28-30 April 2009
  • Firstpage
    311
  • Lastpage
    314
  • Abstract
    A CMOS peak detector for 1-60 GHz RF applications is presented. This peak detector tracks the output voltage of a LNA/VCO and the measured signal is used to tune the LNA/VCO to the desired frequency. Different peak detector circuit topologies are analyzed and their performance metrics such as gain, bandwidth and nature of response are compared. The peak detectors were designed for low (2.4 GHz) and high (55-60 GHz) frequency application and tested using two sample LNAs at their respective frequencies. While one of the proposed CMOS peak detectors (90 nm) exploits the higher fT to achieve 60 GHz operation with optimal power consumption and area overhead, the other low frequency peak detector was designed in 180 nm CMOS. The peak detector is compared with the state of the art detectors. The main advantage of this detector is its minimal area overhead and power consumption.
  • Keywords
    CMOS integrated circuits; integrated circuit design; low noise amplifiers; peak detectors; voltage-controlled oscillators; LNA calibration; RF CMOS peak detectors; VCO; frequency 1 GHz to 60 GHz; frequency 2.4 GHz; frequency 55 GHz to 60 GHz; peak detector circuit topologies; size 180 nm; Calibration; Circuit analysis; Circuit topology; Detectors; Energy consumption; Frequency measurement; Performance analysis; Radio frequency; Voltage; Voltage-controlled oscillators; Calibration; Low Noise Amplifiers (LNA); Peak detector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, Automation and Test, 2009. VLSI-DAT '09. International Symposium on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    978-1-4244-2781-9
  • Electronic_ISBN
    978-1-4244-2782-6
  • Type

    conf

  • DOI
    10.1109/VDAT.2009.5158157
  • Filename
    5158157