• DocumentCode
    2432768
  • Title

    Influence of CdS/CdTe interface properties on the device properties

  • Author

    Dhere, R. ; Rose, D. ; Albin, D. ; Asher, S. ; Al-Jassim, Mowafak ; Cheong, H. ; Swartzlander, A. ; Moutinho, H. ; Coutts, T. ; Ribelin, R. ; Sheldon, P.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    435
  • Lastpage
    438
  • Abstract
    In this paper, the authors have focused on the formation and the role of the CdS/CdTe interface on CdTe solar cells. The devices were made using chemical bath deposited (CBD) CdS on SnO2/glass substrates and the CdTe was deposited by close spaced sublimation (CSS) and subsequently CdCl2 treated and annealed. Compositional analysis showed considerable interdiffusion of Te and S as well as Cl accumulation at the interface. Micro-photoluminescence (PL) analysis reveals sulfur accumulation at the grain boundaries and a graded CdSxTe1-x alloy at the interface. Their analysis leads them to conclude that Cl accumulation and anion vacancies result in a one sided n+-p junction. This model could explain the collection loss in the CdS layer, seen in the spectral response of CdS/CdTe devices
  • Keywords
    II-VI semiconductors; annealing; cadmium compounds; p-n heterojunctions; photoluminescence; semiconductor device testing; semiconductor thin films; solar cells; CdS-CdTe; CdS/CdTe solar cells; accumulation; anion vacancies; close spaced sublimation; collection loss; device properties; grain boundaries; interdiffusion; interface properties; microphotoluminescence analysis; n+-p junction; spectral response; Annealing; Cascading style sheets; Etching; Grain boundaries; Helium; Laboratories; Photovoltaic cells; Renewable energy resources; Temperature; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654121
  • Filename
    654121