• DocumentCode
    2433075
  • Title

    Influence of Na on the electro-optical properties of Cu(In,Ga)Se 2

  • Author

    Keyes, Brian M. ; Hasoon, Falah ; Dippo, Pat ; Balcioglu, Ahmet ; Abulfotuh, Fuad

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    479
  • Lastpage
    482
  • Abstract
    Polycrystalline Cu(In,Ga)Se2 (CIGS) thin films, grown by coevaporation of the constituent elements with different amounts of sodium (Na), were investigated. In some devices, an increased Na content was achieved through the incorporation of a thin layer of NaF deposited on the substrate prior to the growth of CIGS. The effect of Na on the electro-optical properties was addressed through characterization of the finished devices using photoluminescence (PL) and capacitance techniques. Results indicate the beneficial effect of Na as evidenced by increases in the device efficiency, open-circuit voltage, and PL intensity. Furthermore, these measurements provide evidence that Na (1) increases the net carrier concentration, and (2) reduces the number of gap states including those that act as minority-carrier traps
  • Keywords
    carrier density; copper compounds; indium compounds; minority carriers; photoluminescence; semiconductor thin films; sodium; solar cells; ternary semiconductors; vapour deposited coatings; Cu(InGa)Se2-Na; Na; Na content; NaF; capacitance technique; coevaporation; device efficiency increase; electro-optical properties; gap states reduction; minority-carrier traps; net carrier concentration; open-circuit voltage; photoluminescence; polycrystalline Cu(In,Ga)Se2 thin films; solar cells; substrate; thin layer NaF deposition; Conducting materials; Conductivity; Electric variables measurement; Laser excitation; Optical devices; Optical films; Photoluminescence; Spectroscopy; Substrates; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654132
  • Filename
    654132