• DocumentCode
    2433244
  • Title

    The micro-structure and optical properties of Mn-doped ZnO thin film fabricated by sol-gel technique

  • Author

    Wang, Xiu-Qin ; Ding, Jian-Ning ; Yuan, Ning-Yi ; Ding, Gu-Qiao ; Ni, JianLin ; Bao Kan

  • Author_Institution
    Center of Low-dimension Mater., Micro/Nano Device & Syst., Jiangsu Polytech. Univ., Changzhou, China
  • fYear
    2010
  • fDate
    20-23 Jan. 2010
  • Firstpage
    692
  • Lastpage
    695
  • Abstract
    We synthesized undoped and Mn-doped ZnO films on glass substrates using the sol-gel technique. The micro-structure, morphology and optical properties of ZnO films were studied by using X-ray diffraction, Atomic Force Microscope and UV-visible transmission spectra. After annealed at a temperature lower than 550°C by Rapid Thermal Processing (RTP), all the ZnO films are polycrystalline with a hexagonal wurtzite structure. For Mn-doped ZnO films, although no peak corresponding to manganese oxide is observed in XRD spectrums, the lattice constants of the films become larger and the optical band-gaps increase with the increase of annealing temperature, which is different from the result of un-doped ZnO films. These measurements indicate that Mn2+ has substituted for Zn2+ in the films even annealed at a temperature as low as 300°C.
  • Keywords
    II-VI semiconductors; X-ray diffraction; atomic force microscopy; optical constants; rapid thermal annealing; semiconductor growth; semiconductor thin films; sol-gel processing; ultraviolet spectra; visible spectra; wide band gap semiconductors; zinc compounds; SiO2; UV-visible transmission spectra; X-ray diffraction; XRD; ZnO; ZnO:Mn; annealing; atomic force microscope; glass substrates; hexagonal wurtzite structure; lattice constants; manganese oxide; optical band-gaps; optical properties; rapid thermal processing; sol-gel method; temperature 300 degC; Microstructure; Mn-doped ZnO film; Optical property; Sol-gel technique;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6543-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2010.5592503
  • Filename
    5592503