Title :
Tests Of Hidden Periodicities In Nongaussian Noise
Author :
Lii, Keh-Shin ; Tsou, Tai-houn
Keywords :
Background noise; Frequency; Gaussian noise; Higher order statistics; Integrated circuit noise; Signal to noise ratio; Statistical analysis; Testing; Working environment noise; Yttrium;
Conference_Titel :
Higher-Order Spectral Analysis, 1989. Workshop on
DOI :
10.1109/HOSA.1989.735275