Title :
Photoconductive lifetime of CdS used in thin-film solar cells
Author :
Ahrenkiel, R.K. ; Levi, D.H. ; Johnston, S. ; Song, W. ; Mao, D. ; Fischer, A.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fDate :
29 Sep-3 Oct 1997
Abstract :
Thin-film CdS is used as a window layer in most of the current thin-film polycrystalline device technologies including absorbers based on cadmium telluride (CdTe) and copper indium selenide (CIS) and copper indium gallium selenide (CIGS). Device performance has been linked to the deposition technique and post-treatment of the CdS layer. Here we used the radio frequency photoconductive decay (RFPCD) technique to measure the photoconductive lifetime of CdS that had been deposited by various techniques. This includes chemical bath deposition (CBD) and laser deposition. CdCl2 treatment increases the photoconductive response and reduces shallow trapping effects. In addition, tellurium doping was found to significantly decrease the photoconductive response, as well as the hole lifetime, below that of the undoped material. The impact of these CdS properties on device performance is discussed
Keywords :
II-VI semiconductors; cadmium compounds; photoconductivity; photoluminescence; semiconductor growth; semiconductor thin films; solar cells; CdCl2; CdCl2 treatment; CdS; CdTe; CuInGaSe2; CuInSe2; absorbers; cadmium telluride; chemical bath deposition; copper indium gallium selenide; copper indium selenide; deposition technique; hole lifetime; laser deposition; photoconductive lifetime; photoconductive response; photoluminescence measurement; post-treatment; radio frequency photoconductive decay; shallow trapping effects reduction; thin-film CdS window layer; thin-film polycrystalline device; thin-film solar cells; undoped material; Cadmium compounds; Chemical lasers; Computational Intelligence Society; Copper; Indium; Photoconducting materials; Photoconductivity; Photovoltaic cells; Thin film devices; Transistors;
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-3767-0
DOI :
10.1109/PVSC.1997.654146