Title :
Effect of TiO2 on structural and morphology of La0.67Sr0.33Mn1−xTixO3 (LSMO) system
Author :
Abdullah, H. ; Zulfakar, M.S. ; Arsad, Norhana
Author_Institution :
Dept. of Electr., Electron. & Syst., Univ. Kebangsaan Malaysia, Bangi, Malaysia
Abstract :
Samples of La0.67Sr0.33Mn1-xTixO3 with concentration of x = 0.00, 0.20, 0.40 and 0.60 were prepared using the sol gel method, deposited on quartz and ITO substrate by using a spin coater. The samples were calcined at 500°C for an hour. From the Scanning Electron Microscope (SEM) micrograph, it showed that the particles size increased as the concentration of doping was increased. Each sample showed different structural and morphology when the concentration of x was increased. The XRD pattern showed rhombohedral distorted perovskite structure with indices miller (104). Meanwhile, the Atomic Force Microscope (AFM) showed that the average of surface roughness (Ra) of films samples increased as the concentration was increased where average surface roughness was about 5-45nm.
Keywords :
atomic force microscopy; calcination; doping profiles; lanthanum compounds; manganese compounds; particle size; scanning electron microscopy; sol-gel processing; spin coating; strontium compounds; surface roughness; AFM; ITO; ITO substrate; La0.67Sr0.33Mn1-xTixO3; SEM micrograph; SiO2; TiO2 effect; X-ray diffraction; XRD pattern; atomic force microscope; calcination; doping concentration; morphology; particle size; quartz substrate; rhombohedral distorted perovskite structure indices miller; scanning electron microscope; size 5 nm to 45 nm; sol-gel method; spin coater; structural; surface roughness; temperature 500 degC; time 1 hour; Atomic force microscopy; Indium tin oxide; Materials; Morphology; Scanning electron microscopy; Surface morphology;
Conference_Titel :
Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
Conference_Location :
Kota Kinabalu
Print_ISBN :
978-1-61284-844-0
DOI :
10.1109/RSM.2011.6088348
