DocumentCode
2433339
Title
Effect of TiO2 on structural and morphology of La0.67 Sr0.33 Mn1−x Tix O3 (LSMO) system
Author
Abdullah, H. ; Zulfakar, M.S. ; Arsad, Norhana
Author_Institution
Dept. of Electr., Electron. & Syst., Univ. Kebangsaan Malaysia, Bangi, Malaysia
fYear
2011
fDate
28-30 Sept. 2011
Firstpage
301
Lastpage
304
Abstract
Samples of La0.67Sr0.33Mn1-xTixO3 with concentration of x = 0.00, 0.20, 0.40 and 0.60 were prepared using the sol gel method, deposited on quartz and ITO substrate by using a spin coater. The samples were calcined at 500°C for an hour. From the Scanning Electron Microscope (SEM) micrograph, it showed that the particles size increased as the concentration of doping was increased. Each sample showed different structural and morphology when the concentration of x was increased. The XRD pattern showed rhombohedral distorted perovskite structure with indices miller (104). Meanwhile, the Atomic Force Microscope (AFM) showed that the average of surface roughness (Ra) of films samples increased as the concentration was increased where average surface roughness was about 5-45nm.
Keywords
atomic force microscopy; calcination; doping profiles; lanthanum compounds; manganese compounds; particle size; scanning electron microscopy; sol-gel processing; spin coating; strontium compounds; surface roughness; AFM; ITO; ITO substrate; La0.67Sr0.33Mn1-xTixO3; SEM micrograph; SiO2; TiO2 effect; X-ray diffraction; XRD pattern; atomic force microscope; calcination; doping concentration; morphology; particle size; quartz substrate; rhombohedral distorted perovskite structure indices miller; scanning electron microscope; size 5 nm to 45 nm; sol-gel method; spin coater; structural; surface roughness; temperature 500 degC; time 1 hour; Atomic force microscopy; Indium tin oxide; Materials; Morphology; Scanning electron microscopy; Surface morphology;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
Conference_Location
Kota Kinabalu
Print_ISBN
978-1-61284-844-0
Type
conf
DOI
10.1109/RSM.2011.6088348
Filename
6088348
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