• DocumentCode
    2433339
  • Title

    Effect of TiO2 on structural and morphology of La0.67Sr0.33Mn1−xTixO3 (LSMO) system

  • Author

    Abdullah, H. ; Zulfakar, M.S. ; Arsad, Norhana

  • Author_Institution
    Dept. of Electr., Electron. & Syst., Univ. Kebangsaan Malaysia, Bangi, Malaysia
  • fYear
    2011
  • fDate
    28-30 Sept. 2011
  • Firstpage
    301
  • Lastpage
    304
  • Abstract
    Samples of La0.67Sr0.33Mn1-xTixO3 with concentration of x = 0.00, 0.20, 0.40 and 0.60 were prepared using the sol gel method, deposited on quartz and ITO substrate by using a spin coater. The samples were calcined at 500°C for an hour. From the Scanning Electron Microscope (SEM) micrograph, it showed that the particles size increased as the concentration of doping was increased. Each sample showed different structural and morphology when the concentration of x was increased. The XRD pattern showed rhombohedral distorted perovskite structure with indices miller (104). Meanwhile, the Atomic Force Microscope (AFM) showed that the average of surface roughness (Ra) of films samples increased as the concentration was increased where average surface roughness was about 5-45nm.
  • Keywords
    atomic force microscopy; calcination; doping profiles; lanthanum compounds; manganese compounds; particle size; scanning electron microscopy; sol-gel processing; spin coating; strontium compounds; surface roughness; AFM; ITO; ITO substrate; La0.67Sr0.33Mn1-xTixO3; SEM micrograph; SiO2; TiO2 effect; X-ray diffraction; XRD pattern; atomic force microscope; calcination; doping concentration; morphology; particle size; quartz substrate; rhombohedral distorted perovskite structure indices miller; scanning electron microscope; size 5 nm to 45 nm; sol-gel method; spin coater; structural; surface roughness; temperature 500 degC; time 1 hour; Atomic force microscopy; Indium tin oxide; Materials; Morphology; Scanning electron microscopy; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro and Nanoelectronics (RSM), 2011 IEEE Regional Symposium on
  • Conference_Location
    Kota Kinabalu
  • Print_ISBN
    978-1-61284-844-0
  • Type

    conf

  • DOI
    10.1109/RSM.2011.6088348
  • Filename
    6088348