DocumentCode :
2433355
Title :
Pseudorandomness from Shrinkage
Author :
Impagliazzo, Russell ; Meka, Raghu ; Zuckerman, David
Author_Institution :
Inst. for Adv. Study, Univ. of California, San Diego, La Jolla, CA, USA
fYear :
2012
fDate :
20-23 Oct. 2012
Firstpage :
111
Lastpage :
119
Abstract :
One powerful theme in complexity theory and pseudorandomness in the past few decades has been the use lower bounds to give pseudorandom generators (PRGs). However, the general results using this hardness vs. randomness paradigm suffer a quantitative loss in parameters, and hence do not give nontrivial implications for models where we don´t know superpolynomial lower bounds but do know lower bounds of a fixed polynomial. We show that when such lower bounds are proved using random restrictions, we can construct PRGs which are essentially best possible without in turn improving the lower bounds. More specifically, say that a circuit family has shrinkage exponent Γ if a random restriction leaving a p fraction of variables unset shrinks the size of any circuit in the family by a factor of pΓ+o(1). Our PRG uses a seed of length s1/(Γ+1)+o(1) to fool circuits in the family of size s. By using this generic construction, we get PRGs with polynomially small error for the following classes of circuits of size s and with the following seed lengths: 1) For de Morgan formulas, seed length s1/3+o(1); 2) For formulas over an arbitrary basis, seed length s1/2+o(1); 3) For read-once de Morgan formulas, seed length s.234...; 4) For branching programs of size s, seed length s1/2+o(1). The previous best PRGs known for these classes used seeds of length bigger than n/2 to output n bits, and worked only when the size s = O(n) [1].
Keywords :
computational complexity; polynomials; random number generation; PRG; branching programs; complexity theory; de Morgan formulas; fixed polynomial lower bounds; pseudorandom generators; pseudorandomness; randomness paradigm; seed length; shrinkage; Complexity theory; Computational modeling; Generators; Input variables; Integrated circuit modeling; Polynomials; Random variables; average-case lowerbounds; pseudorandomness; random restrictions; shrinkage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Foundations of Computer Science (FOCS), 2012 IEEE 53rd Annual Symposium on
Conference_Location :
New Brunswick, NJ
ISSN :
0272-5428
Print_ISBN :
978-1-4673-4383-1
Type :
conf
DOI :
10.1109/FOCS.2012.78
Filename :
6375288
Link To Document :
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