• DocumentCode
    2433372
  • Title

    The morphology of CdS thin films deposited on SnO2-coated glass substrates [for solar cells]

  • Author

    Hasoon, F.S. ; Al-Jassim, M.M. ; Swartzlander, A. ; Sheldon, P. ; Al-Douri, A.A.J. ; Alnajjar, A.A.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    1997
  • fDate
    29 Sep-3 Oct 1997
  • Firstpage
    543
  • Lastpage
    546
  • Abstract
    The morphology and microstructure of cadmium sulfide (CdS) thin films are a major concern in the fabrication process of CdTe solar cells. In this work, we investigate the morphology and microstructure of chemical-bath-deposited CdS in order to better understand the growth conditions that give rise to films for optimum device performance. The film morphology was investigated by field-emission, high-resolution scanning electron microscopy (SEM). The film microstructure was studied by transmission electron microscopy (TEM), while the film´s chemistry was investigated by Auger electron spectroscopy (AES). All films examined exhibited pinholes and discontinuities varying in size and density. This may have a significant impact on cell performance by providing shunt paths between the CdTe and the SnO2. Additionally, the CdS films are heavily faulted, which may partially explain why a high density of planar defects is observed in the CdTe/CdS interface region
  • Keywords
    Auger effect; II-VI semiconductors; cadmium compounds; crystal defects; crystal microstructure; crystal morphology; scanning electron microscopy; semiconductor device testing; semiconductor growth; semiconductor thin films; solar cells; substrates; transmission electron microscopy; Auger electron spectroscopy; CdS thin films; CdS-CdTe; CdS-CdTe solar cells; SnO2; SnO2-coated glass substrates; chemical bath deposition; discontinuities; fabrication process; growth conditions; microstructure; morphology; optimum device performance; pinholes; planar defects; scanning electron microscopy; transmission electron microscopy; Cadmium compounds; Chemicals; Fabrication; Microstructure; Morphology; Photovoltaic cells; Scanning electron microscopy; Sputtering; Transistors; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-3767-0
  • Type

    conf

  • DOI
    10.1109/PVSC.1997.654148
  • Filename
    654148