• DocumentCode
    243367
  • Title

    A History-Based Dynamic Random Software Testing

  • Author

    Lei Zhang ; Bei-Bei Yin ; Junpeng Lv ; Kai-Yuan Cai ; Yau, Stephen S. ; Jia Yu

  • Author_Institution
    Dept. of Autom. Control, Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
  • fYear
    2014
  • fDate
    21-25 July 2014
  • Firstpage
    31
  • Lastpage
    36
  • Abstract
    Following the idea of software cybernetics, Dynamic Random Testing (DRT) was proposed to improve the traditional random testing and random-partition testing strategies. The essential idea of Dynamic Random Testing is to update the testing profile dynamically during the software testing according to test data collected online. As a result, the sub domains which have higher defect detection rate are selected more easily. There are some shortcomings in the original DRT, such as it is not rigorous to update the testing profile each time merely according to whether a test case reveals defects or not. In order to overcome the shortcomings in the original DRT, a History-based Dynamic Random Testing is proposed on the basis of DRT and it is denoted as DRT-h. In DRT-h strategy, the estimate of the defect detection rate of each sub domain is calculated in real-time during the software testing by using history testing information. In this paper some real-life software were used to verify the effect of DRT and DRT-h, and the experiments show that DRT-h outperforms random testing, random-partition testing and Dynamic Random Testing greatly.
  • Keywords
    program testing; DRT-h strategy; defect detection rate estimation; history testing information; history-based dynamic random software testing; random-partition testing; Aerodynamics; Cybernetics; Flexible printed circuits; Measurement; Software; Software testing; history-based dynamic random testing; random testing; software cybernetic; testing profile;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference Workshops (COMPSACW), 2014 IEEE 38th International
  • Conference_Location
    Vasteras
  • Type

    conf

  • DOI
    10.1109/COMPSACW.2014.9
  • Filename
    6903101