• DocumentCode
    2433824
  • Title

    Identification of electrical model parameters by results of RTS numerical simulation

  • Author

    Abramov, Li ; Goncharenko, I.A. ; Korolev, A.V.

  • Author_Institution
    Belarussian State Univ. of Inf. & Radioelectron., Minsk, Byelorussia
  • fYear
    2000
  • fDate
    11-15 Sept. 2000
  • Firstpage
    418
  • Lastpage
    420
  • Abstract
    Identification of electrical parameters by results of numerical simulation of resonant-tunneling structures (RTS) is proposed. The method is realized using the RTS simulator EC-RTS-NANODEV. The example of identification of resonant-tunneling diode (RTD) parameters is shown. A new numerical simulation model of RTS is also presented.
  • Keywords
    microwave devices; numerical analysis; parameter estimation; resonant tunnelling devices; semiconductor device models; EC-RTS-NANODEV simulator; RTD parameters; electrical model parameters; numerical simulation; parameter identification; resonant-tunneling diode parameters; resonant-tunneling structures; Helium; IEEE catalog; Indium tin oxide; Microwave technology; Numerical simulation; Organizing; Physics; Resonant tunneling devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2000. Microwave and Telecommunication Technology. 2000 10th International Crimean
  • Conference_Location
    Crimea, Ukraine
  • Print_ISBN
    966-572-048-1
  • Type

    conf

  • DOI
    10.1109/CRMICO.2000.1256165
  • Filename
    1256165