• DocumentCode
    2433962
  • Title

    The growth of SiC micro-pillar array by vapor-liquid-solid mechanism

  • Author

    Chen, Yi F. ; Liu, Xing Z. ; Deng, Xin W. ; Li, Yan R.

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2010
  • fDate
    20-23 Jan. 2010
  • Firstpage
    1133
  • Lastpage
    1135
  • Abstract
    Silicon carbide (SiC) is a IV-IV compound semiconductor material with a wide band gap. Semiconductor electronic devices and circuits made from SiC are presently being developed for high-temperature, high-power, and high-radiation conditions in which conventional semiconductors can not adequately perform. In this study, 3C-SiC micro-pillar arrays were fabricated on Si substrate by chemical vapor deposition (CVD). Silane and acetylene were used as the source gas. The arrays of circular features were fabricated on Si substrate by ion beam etching. Then nickel as the catalyst was filled into the features by electroplating. 3C-SiC micro-pillar arrays were selective grown in the circular features via the vapor-liquid-solid (VLS) process. The morphology, structure and stoichiometry of the SiC micro-pillar arrays were studied.
  • Keywords
    catalysis; chemical vapour deposition; crystal morphology; electroplating; etching; ion beam effects; semiconductor growth; silicon compounds; stoichiometry; wide band gap semiconductors; CVD; IV-IV compound semiconductor material; Si; SiC; acetylene; catalysis; chemical vapor deposition; electroplating; gas source; high-power condition; high-radiation condition; high-temperature condition; ion beam etching; micro-pillar array; morphology; semiconductor electronic circuits; semiconductor electronic devices; semiconductor growth; silane; silicon carbide; stoichiometry; vapor-liquid-solid mechanism; wide band gap semiconductors; 3C-SiC; CVD; VLS; micro-pillar;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6543-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2010.5592539
  • Filename
    5592539