Title :
Microcrystalline silicon from very high frequency plasma deposition and hot-wire CVD for `micromorph´ tandem solar cells
Author :
Brummack, H. ; Bruggemann, R. ; Wanka, H.N. ; Hierzenberger, A. ; Schubert, M.B.
Author_Institution :
Inst. fur Phys. Elektronik, Stuttgart Univ., Germany
fDate :
29 Sep-3 Oct 1997
Abstract :
The authors have grown microcrystalline silicon from a glow discharge at very high frequencies of 55 MHz and 170 MHz with high hydrogen dilution, and also, at more than 10 times higher growth rates, similar films by hot-wire chemical vapor deposition. Both kinds of materials have extensively been characterized and compared in terms of structural, optical and electronic properties, which greatly improve by deposition in a multi- instead of a single-chamber system. Incorporation of these different materials into p-i-n solar cells results in open circuit voltages of about 400 mV as long as the doped layers are microcrystalline and rise to more than 870 mV if amorphous p- and n-layers are used. Quantum efficiencies and fill factors are still poor but leave room for further improvement, as clearly demonstrated by a remarkable reverse bias quantum efficiency gain
Keywords :
CVD coatings; chemical vapour deposition; elemental semiconductors; plasma deposition; semiconductor device testing; semiconductor growth; semiconductor thin films; silicon; solar cells; 170 MHz; 400 mV; 55 MHz; Si; electronic properties; fill factors; hot-wire CVD; microcrystalline silicon growth; micromorph tandem solar cells; open circuit voltage; optical properties; p-i-n solar cells; reverse bias quantum efficiency gain; structural properties; very high frequency plasma deposition; Chemical vapor deposition; Frequency; Glow discharges; Hydrogen; Optical films; Optical materials; Plasma chemistry; Plasma materials processing; Semiconductor films; Silicon;
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-3767-0
DOI :
10.1109/PVSC.1997.654180