DocumentCode :
2434109
Title :
Bias modeling for image denoising
Author :
Chatterjee, Priyam ; Milanfar, Peyman
Author_Institution :
Dept. of Electr. Eng., Univ. of California Santa Cruz, Santa Cruz, CA, USA
fYear :
2009
fDate :
1-4 Nov. 2009
Firstpage :
856
Lastpage :
859
Abstract :
In this paper, we study the bias characteristics of image denoising algorithms. Recently introduced state-of-the-art denoising methods produce biased estimates of pixel intensities. The bias in each case is dependent on the underlying image geometry. Hence, we cluster the image into groups of patches that share a common underlying structure and study the bias independently in each cluster. We show that the bias in each cluster can be modeled effectively by an affine function, where the parameters of the model differ between clusters and algorithms. We validate our model through experimental results, both visually and quantitatively.
Keywords :
image denoising; pattern clustering; affine function; bias characteristics; clusters algorithms; image denoising algorithms; image geometry; pixel intensities; state-of- the-art denoising methods; Clustering algorithms; Data models; Geometry; Image denoising; Image processing; Noise reduction; Pixel; Random variables; Solid modeling; State estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signals, Systems and Computers, 2009 Conference Record of the Forty-Third Asilomar Conference on
Conference_Location :
Pacific Grove, CA
ISSN :
1058-6393
Print_ISBN :
978-1-4244-5825-7
Type :
conf
DOI :
10.1109/ACSSC.2009.5469988
Filename :
5469988
Link To Document :
بازگشت