DocumentCode
2434158
Title
High aspect ratio 3-D electroplating assisted by localized laser irradiation
Author
Park, Jungwoo ; Kim, Hanseup
Author_Institution
Dept. of Electr. & Comput., Univ. of Utah, Salt Lake City, UT, USA
fYear
2010
fDate
20-23 Jan. 2010
Firstpage
1120
Lastpage
1123
Abstract
We report a high-aspect ratio electroplating technique that is assisted by focused laser irradiation to construct further narrow and tall three-dimensional (3-D) microstructures. Focused laser irradiation strengthens localized electrical field near the focal spot, thus enabling faster nucleation of ions and construction of higher aspect ratio pillars than typical chemical electroplating. We compared electroplating properties with and without laser irradiation, by investigating the profile, speed, and material elements of the fabricated microstructures. Laser-assisted electroplating enhanced the basement deposition speed by 31% to 1.7 nm/s from the 1.3 nm/s of the traditional electrochemical deposition without laser irradiation under a low current density (4 mA/cm2). This technique allowed vertical pillars to grow in a reduced diameter of 85 urn, which is down by 20% compared to the diameter of 110 urn without laser assistance. The electroplated nickel pillars have resulted in 24% less oxygen in the final structures showing the improved homogeneity of materials. Lateral nickel branches are also produced with a higher deposition rate than traditional method.
Keywords
crystal microstructure; electrochemistry; electroplating; laser beam effects; nucleation; optical self-focusing; 3D electroplating; electrochemical deposition; electroplated nickel pillars; focal spot; focused laser irradiation; high-aspect ratio electroplating; ion nucleation; laser assisted electroplating; localized electrical field; localized laser irradiation; three-dimensional microstructures;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location
Xiamen
Print_ISBN
978-1-4244-6543-9
Type
conf
DOI
10.1109/NEMS.2010.5592549
Filename
5592549
Link To Document