DocumentCode :
2434187
Title :
Large area a-Si/a-Si tandem module with 9.1% conversion efficiency
Author :
Terzini, E. ; Privato, C. ; Avagliano, S.
Author_Institution :
ENEA Centro Ricerche, Portici, Italy
fYear :
1997
fDate :
29 Sep-3 Oct 1997
Firstpage :
707
Lastpage :
710
Abstract :
This work illustrates the research activity carried out at ENEA for the achievement of high efficiency large area a-Si modules by a low cost process involving a simple single chamber PECVD reactor. Device optimization leading to small area (1 cm2) single and tandem a-Si junctions exceeding 10% efficiency is described. Details of fabrication process, such as back-reflector, microcrystalline layers, interface cleaning process, adjustment of i-layer absorption and device thermal annealing are given. In addition, the results of laser scribing interconnection technique for module realization are also described. Back scribing and modified beam power distribution were effective for the improvement of module efficiency. A pin/pin tandem module with initial efficiency of 9.1%, on active area of 750 cm2, has been realized. This is the best efficiency ever reported by a European laboratory for a-Si large area tandem modules
Keywords :
amorphous semiconductors; elemental semiconductors; plasma CVD coatings; semiconductor thin films; silicon; solar cell arrays; 9.1 percent; ENEA; Si-Si; a-Si thin film technology; a-Si/a-Si tandem module; back scribing; back-reflector; conversion efficiency; device optimization; device thermal annealing; i-layer absorption; interface cleaning process; large area a-Si modules; laser scribing interconnection; low cost process; microcrystalline layers; modified beam power distribution; pin/pin tandem module; research activity; single chamber PECVD reactor; solar arrays; Absorption; Costs; Inductors; Optical films; Optical polymers; PIN photodiodes; Solar power generation; Substrates; Temperature; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1997., Conference Record of the Twenty-Sixth IEEE
Conference_Location :
Anaheim, CA
ISSN :
0160-8371
Print_ISBN :
0-7803-3767-0
Type :
conf
DOI :
10.1109/PVSC.1997.654187
Filename :
654187
Link To Document :
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