• DocumentCode
    2434315
  • Title

    The ultra-low absorption investigation in dielectrics and atmosphere within 45-200 GHz frequency band

  • Author

    Parshin, V.V. ; Krupnov, A.F. ; Myasnikova, S.E. ; Tretyakov, M.Yu. ; Shanin, V.N.

  • Author_Institution
    Inst. of Appl. Phys., Acad. of Sci., Nizhny Novgorod, Russia
  • fYear
    2000
  • fDate
    11-15 Sept. 2000
  • Firstpage
    490
  • Lastpage
    492
  • Abstract
    The new generation set of 45-200 GHz band for the investigation of dielectric absorption, including the atmosphere is created. Special attention is paid both to the investigation of ultralow absorption in the modern high-quality dielectrics, including thin films and to the atmospheric absorption, including the lines of oxygen and water absorption. It was found that Si and diamond output windows for the megawatt microwave gyrotrons have the essential absorption in thin, /spl Lt//spl lambda/, surface layer, leading to surface discharges. Practically all rolled film materials have the distinct anisotropy of dielectric parameters, which also depend upon the producer. The results of atmospheric absorption measurement have been compared with theoretical models.
  • Keywords
    anisotropic media; atmospheric electromagnetic wave propagation; electromagnetic wave absorption; millimetre wave propagation; surface discharges; anisotropy; atmospheric absorption; dielectric absorption; dielectric parameters; megawatt microwave gyrotrons; rolled film materials; surface discharges; ultra-low absorption investigation; Anisotropic magnetoresistance; Atmosphere; Atmospheric measurements; Dielectric materials; Dielectric measurements; Dielectric thin films; Electromagnetic wave absorption; Frequency; Gyrotrons; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2000. Microwave and Telecommunication Technology. 2000 10th International Crimean
  • Conference_Location
    Crimea, Ukraine
  • Print_ISBN
    966-572-048-1
  • Type

    conf

  • DOI
    10.1109/CRMICO.2000.1256194
  • Filename
    1256194