Title :
A model of temperature cycling performance in plastic encapsulated packages
Author :
Syndergaard, Paul ; Young, Jim
Author_Institution :
American Microsyst. Inc., Pocatello, ID, USA
Abstract :
A requirement for many customers of semiconductors encapsulated in plastic packages is the ability to survive 1000 cycles of air-to-air (gas-to-gas) temperature cycle under the conditions of -65°C to +150°C. A series of experiments were performed to model the performance of molding compounds relative to die size. The model was then correlated to the historical temperature cycling data of an encapsulant independent of package size or type. The temperature cycle performance can now be predicted based on die size. The package size or type is incidental, a larger package is generally required for a larger die
Keywords :
encapsulation; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; life testing; plastic packaging; production testing; -65 to 150 degC; air-to-air temperature cycle; die size; model; molding compounds; plastic encapsulated packages; temperature cycling performance; Ambient intelligence; Application specific integrated circuits; Geometry; History; Neck; Passivation; Physics; Plastic packaging; Semiconductor device packaging; Temperature;
Conference_Titel :
Integrated Reliability Workshop, 1994. Final Report., 1994 International
Conference_Location :
Lake Tahoe, CA
Print_ISBN :
0-7803-1908-7
DOI :
10.1109/IRWS.1994.515824