DocumentCode
2434651
Title
Soft X-Ray Resonant Magnetic Reflectivity Study of Thin Films and Multilayers
Author
Tonnerre, J.M.
Author_Institution
Laboratoire de Cristallographie, France
fYear
1998
fDate
6-9 Jan. 1998
Firstpage
27
Lastpage
27
Keywords
Iron; Magnetic analysis; Magnetic field induced strain; Magnetic films; Magnetic moments; Magnetic multilayers; Magnetic resonance; Optical films; Reflectivity; Soft magnetic materials;
fLanguage
English
Publisher
ieee
Conference_Titel
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-5118-5
Type
conf
DOI
10.1109/INTMAG.1998.735518
Filename
735518
Link To Document