• DocumentCode
    2434673
  • Title

    Hard X-Ray Reflectivity on Thin Co Films

  • Author

    Lott, D. ; Kao, C.C. ; Hastings, J.B. ; Freeland, J.W.

  • Author_Institution
    NSLS, Brookhaven Natl. Lab., Upton, NY
  • fYear
    1998
  • fDate
    6-9 Jan. 1998
  • Firstpage
    28
  • Lastpage
    28
  • Keywords
    Brillouin scattering; Iron; Light scattering; Magnetic field measurement; Magnetic films; Magnetic resonance; Optical films; Optical scattering; Reflectivity; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-5118-5
  • Type

    conf

  • DOI
    10.1109/INTMAG.1998.735519
  • Filename
    735519