Title :
Techniques for measuring error motions of a precise rotational stage
Author :
Shin, Dongik ; Kim, Jinho ; Yun, Deokwon ; Han, Changsoo ; Lee, Sangmoo
Author_Institution :
Hanyang Univ., Ansan
Abstract :
Rotating stages in semiconductor industry, biotechnology and many other fields require challenging accuracy to perform their functions properly. To evaluate and improve the performance of such precision machinery, it is inevitable to consider the error motion on which knowledge can be used for error compensation, error-reducing design, and other improvement activity. In this study we have measured the 5 DOF error motions of a rotating stage with capacitive sensors. To achieve the measurement accuracy, we have used Donaldson´s reversal, Estler´s reversal, and other techniques. We have designed a sensor jig to achieve measurement including reversals effectively.
Keywords :
capacitive sensors; motion measurement; Donaldson reversal; Estler reversal; biotechnology; capacitive sensors; error compensation; error motion measurement; error-reducing design; precision machinery; semiconductor industry; Automatic control; Control systems; Electronics industry; Frequency; Machinery; Mechanical engineering; Metrology; Motion control; Motion measurement; Rotation measurement; error motion; rotating stage; spindle metrology;
Conference_Titel :
Control, Automation and Systems, 2007. ICCAS '07. International Conference on
Conference_Location :
Seoul
Print_ISBN :
978-89-950038-6-2
Electronic_ISBN :
978-89-950038-6-2
DOI :
10.1109/ICCAS.2007.4406833