• DocumentCode
    2435084
  • Title

    Simple sticking models and adhesion criterion to predict sticking effects of fixed-fixed beams in RF MEMS switch design

  • Author

    Hui, Yu ; Yang, Kai ; Jiao, Binbin ; Jing, Yupeng ; Chen, Dapeng

  • Author_Institution
    Inst. of Microelectron., Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    20-23 Jan. 2010
  • Firstpage
    997
  • Lastpage
    1001
  • Abstract
    The fixed-fixed beam in RF switches fabricated by MEMS techniques of a sacrificial layer is inclined to stick to the substrate due to the significant capillary force during drying process. In this paper, sticking models of the fixed-fixed beam are investigated to analyze the sticking effect. Based on these models, an adhesion criterion hc for the fixed-fixed beam is derived to determine whether the beam sticks to the substrate or not. The deduced formula shows that hc is determined by the material property of the beam and its length L and thickness t. It is also found that the width of the beam has no effect on hc. The theoretical models and adhesion criterion are simulated and verified by Finite Element Analysis. The effects of residual stress are also discussed to meet the uncertainty of real fabrication processes.
  • Keywords
    adhesion; drying; finite element analysis; internal stresses; microfabrication; microswitches; RF MEMS switch design; RF switches fabrication; adhesion criterion; drying process; finite element analysis; fixed-fixed beams; material property; residual stress; sacrificial layer; sticking effect prediction; MEMS; RF switch; fixed-fixed beam; sticking effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6543-9
  • Type

    conf

  • DOI
    10.1109/NEMS.2010.5592597
  • Filename
    5592597