DocumentCode
2435084
Title
Simple sticking models and adhesion criterion to predict sticking effects of fixed-fixed beams in RF MEMS switch design
Author
Hui, Yu ; Yang, Kai ; Jiao, Binbin ; Jing, Yupeng ; Chen, Dapeng
Author_Institution
Inst. of Microelectron., Chinese Acad. of Sci., Beijing, China
fYear
2010
fDate
20-23 Jan. 2010
Firstpage
997
Lastpage
1001
Abstract
The fixed-fixed beam in RF switches fabricated by MEMS techniques of a sacrificial layer is inclined to stick to the substrate due to the significant capillary force during drying process. In this paper, sticking models of the fixed-fixed beam are investigated to analyze the sticking effect. Based on these models, an adhesion criterion hc for the fixed-fixed beam is derived to determine whether the beam sticks to the substrate or not. The deduced formula shows that hc is determined by the material property of the beam and its length L and thickness t. It is also found that the width of the beam has no effect on hc. The theoretical models and adhesion criterion are simulated and verified by Finite Element Analysis. The effects of residual stress are also discussed to meet the uncertainty of real fabrication processes.
Keywords
adhesion; drying; finite element analysis; internal stresses; microfabrication; microswitches; RF MEMS switch design; RF switches fabrication; adhesion criterion; drying process; finite element analysis; fixed-fixed beams; material property; residual stress; sacrificial layer; sticking effect prediction; MEMS; RF switch; fixed-fixed beam; sticking effect;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems (NEMS), 2010 5th IEEE International Conference on
Conference_Location
Xiamen
Print_ISBN
978-1-4244-6543-9
Type
conf
DOI
10.1109/NEMS.2010.5592597
Filename
5592597
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