DocumentCode :
2435306
Title :
Influence of diamond additions on lead-free Sn-Zn-Bi solder-alloys
Author :
Qin, Pei ; Hu, Xiao ; Chan, Y C
Author_Institution :
Department of Electronic Engineering, City University of Hong Kong, Hong Kong
fYear :
2012
fDate :
17-20 Sept. 2012
Firstpage :
1
Lastpage :
4
Abstract :
In this work, diamond nano-particles doped Sn-8Zn-3Bi solder alloys have been studied. The microstructure and the interfacial reactions of the plain solder joints and solder joints containing diamond nano-particles were investigated under current density of 5×103 A/cm2 at temperature of 100°C with Cu pads on daisy chain type ball grid array (BGA) substrates. It was found diamond nano-particles doped in solder joints refined the microstructure and retarded the formation of Cu5Zn8 intermetallic compounds (IMCs). The shear strength of solder joints containing diamond nano-particles exhibited higher value than that of plain solder joint. In addition, the fracture surface of doped solder joints appeared ductile behavior with very rough dimpled surfaces. DSC analyses of plain and doped solders revealed the onset and melting temperatures of solder alloys with diamond additions kept nearly unchanged, indicating its potentially viable applications and benefits.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2012 4th
Conference_Location :
Amsterdam, Netherlands
Print_ISBN :
978-1-4673-4645-0
Type :
conf
DOI :
10.1109/ESTC.2012.6542091
Filename :
6542091
Link To Document :
بازگشت