DocumentCode :
2435629
Title :
Measurement of Elastic Properties and Surface Wave Parameters in Thin Films
Author :
Rowel, N.L. ; Stegeman, G.I.
fYear :
1978
fDate :
1978
Firstpage :
413
Lastpage :
416
Keywords :
Brillouin scattering; Frequency; Optical attenuators; Optical films; Optical surface waves; Piezoelectric films; Substrates; Surface acoustic waves; Surface waves; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1978 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1978.197073
Filename :
1534013
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2435629
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