• DocumentCode
    2435963
  • Title

    Experimental study of xenon and tin discharge produced plasma EUV light source

  • Author

    Watanabe, Masato ; Kishi, Nozomu ; Yamada, Junzaburo ; Sakuchi, Osamu ; Fei, Jiang ; Qiushi, Zhu ; Okino, Akitoshi ; Horioka, Kazuhiko ; Hotta, Eiki

  • Author_Institution
    Dept. of Energy Sci., Tokyo Inst. of Technol., Yokohama
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Recently, a lot of progresses have been made in the field of gas discharge and laser assisted extreme ultraviolet (EUV) light sources. In order to realize the EUV lithography, we have been developing the discharge produced plasma EUV light source with either Xe or Sn fuels. A Xe gas jet Z-pinch discharge system has been developed for generating high quality debris-free EUV emission. A 25kA pulsed power supply system has been constructed and introduced. Observation of optical characteristics are presently in progress. Also, the laser triggered discharge produced plasma with Sn electrode system has been constructed. In our system, after Nd-YAG laser was irradiated on Sn electrode surface for triggering the main discharge, EUV radiation will occur from the generated Sn plasma between electrodes and be collected radially. The maximum discharge current of about 6 kA with a pulse width of 500 ns was supplied to anode-cathode gap. In present study, EUV radiation emitted from gas jet Z- pinch Xe plasma and laser triggered Sn discharge produced plasma was quantitatively measured using an in-band calorimeter. Time-resolved in-band source image measurement was also conducted using a pinhole camera system.
  • Keywords
    Z pinch; discharges (electric); plasma production by laser; plasma sources; tin; ultraviolet sources; xenon; EUV lithography; Nd-YAG laser; Sn; Sn electrode surface; Xe; anode-cathode gap; gas discharge; gas jet Z-pinch discharge system; in-band calorimeter; laser assisted extreme ultraviolet light sources; pinhole camera system; plasma EUV light source; pulsed power supply; time-resolved in-band source image measurement; tin discharge; xenon discharge; Fault location; Gas lasers; Light sources; Plasma measurements; Plasma properties; Plasma sources; Surface emitting lasers; Tin; Ultraviolet sources; Xenon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2008. ICOPS 2008. IEEE 35th International Conference on
  • Conference_Location
    Karlsruhe
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-1929-6
  • Electronic_ISBN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2008.4590703
  • Filename
    4590703