Title :
Design and realisation of apparatus to study capillary discharge in gas
Author :
Young June Hong ; Phil Yong Oh ; Gi Chung Kwon ; Hee Myoung Shin ; Eun Ha Choi
Author_Institution :
PDP Res. Center, Kwangwoon Univ., Seoul
Abstract :
Summary form only given. We have generated Xe plasma in dense plasma focus device of coaxial electrode for extreme ultraviolet lithography (EUVL) and investigated an emitted visible light for electro-optical plasma diagnostics. We have applied an input voltage 4.5 kV to the capacitor bank and the diode chamber have been filled with Xe gas of pressure 40 mTorr. The inner surface of cylindrical cathode have been attatched by an acrylic insulator. The electron temperature and density of the coaxial plasma focus were obtained by the optical emission spectroscopy (OES). The electron temperature has been measured by the two relative line intensity and Boltzmann plot. In case of electron density, it has been observed by the Stark broadening method. This experiment shows that the electron temperature and density characteristics for a focused plasma can be influenced by the acrylic insulator length installed onto the cathode surface and materials of anode. The EUV emission signal whose wavelength is about 6-16 nm has been detected by using a photo-detector (AXUV-100 Zr/C, IRD).
Keywords :
electron density; plasma density; plasma diagnostics; plasma focus; plasma temperature; ultraviolet lithography; Boltzmann plot; EUV emission; Stark broadening; acrylic insulator; capacitor bank; coaxial electrode; cylindrical cathode; dense plasma focus device; diode chamber; electro-optical plasma diagnostics; electron density; electron temperature; emitted visible light; extreme ultraviolet lithography; input voltage; optical emission spectroscopy; photo-detector; pressure 40 mtorr; voltage 4.5 kV; Cathodes; Coaxial components; Electrons; Optical surface waves; Plasma density; Plasma devices; Plasma diagnostics; Plasma measurements; Plasma temperature; Ultraviolet sources;
Conference_Titel :
Plasma Science, 2008. ICOPS 2008. IEEE 35th International Conference on
Conference_Location :
Karlsruhe
Print_ISBN :
978-1-4244-1929-6
Electronic_ISBN :
0730-9244
DOI :
10.1109/PLASMA.2008.4590706