Title :
Electronic Speckle Pattern Interferom-etry for JWVST
Author :
Saif, Babak ; Bluth, Marcel ; Eegholm, Bente ; Zukowski, Barbara ; Keski-Kuha, Ritva ; Blake, Peter
Author_Institution :
Space Telescope Sci. Inst., Baltimore
Abstract :
Development of many new technologies is required to successfully produce the large, lightweight, deployable, cryogenic telescope with segmented primary mirror for the James Webb Space Telescope (JWST) mission. One of the technologies is interferometry to verify structural deformations in large, deployable, lightweight, cryogenic, precision structures to nanometer level accuracy. An instantaneous acquisition phase shifting speckle interferometer was designed and built to support the development of JWST optical telescope element (OTE) primary mirror backplane. This paper discusses characterization of the electronic speckle pattern interferometer (SPS-DSPI) developed for JWST to verify its capability to measure structural deformations in large composite structures at cryogenic temperature.
Keywords :
aerospace instrumentation; astronomical telescopes; electronic speckle pattern interferometry; infrared astronomy; James Webb Space Telescope; cryogenic temperature; electronic speckle pattern interferometry; instantaneous acquisition phase shifting speckle interferometer; structural deformations; Cryogenics; Mirrors; Nanostructures; Optical design; Optical interferometry; Phase shifting interferometry; Space missions; Space technology; Speckle; Telescopes;
Conference_Titel :
Aerospace Conference, 2007 IEEE
Conference_Location :
Big Sky, MT
Print_ISBN :
1-4244-0524-6
Electronic_ISBN :
1095-323X
DOI :
10.1109/AERO.2007.353007
