• DocumentCode
    2436363
  • Title

    Integrated nano scale multilayer systems for reactive bonding in microsystems technology

  • Author

    Braeuer, J. ; Besser, Jurgen ; Wiemer, M. ; Gessner, T.

  • Author_Institution
    Fraunhofer Institute for Electronic Nano Systems (ENAS) Technologie-Campus 3, 09126 Chemnitz, Germany
  • fYear
    2012
  • fDate
    17-20 Sept. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper is presenting a metallic wafer bond process at room-temperature by using nano scale and integrated Pd/Al reactive multilayer systems. These systems are used as controllable and internal heat sources. By controlling the reaction properties of the systems strong and high yield wafer bonding of Si-Si, Si-glass as well as Si-ceramic without any significant defects is possible.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic System-Integration Technology Conference (ESTC), 2012 4th
  • Conference_Location
    Amsterdam, Netherlands
  • Print_ISBN
    978-1-4673-4645-0
  • Type

    conf

  • DOI
    10.1109/ESTC.2012.6542144
  • Filename
    6542144