Title :
Integrated nano scale multilayer systems for reactive bonding in microsystems technology
Author :
Braeuer, J. ; Besser, Jurgen ; Wiemer, M. ; Gessner, T.
Author_Institution :
Fraunhofer Institute for Electronic Nano Systems (ENAS) Technologie-Campus 3, 09126 Chemnitz, Germany
Abstract :
This paper is presenting a metallic wafer bond process at room-temperature by using nano scale and integrated Pd/Al reactive multilayer systems. These systems are used as controllable and internal heat sources. By controlling the reaction properties of the systems strong and high yield wafer bonding of Si-Si, Si-glass as well as Si-ceramic without any significant defects is possible.
Conference_Titel :
Electronic System-Integration Technology Conference (ESTC), 2012 4th
Conference_Location :
Amsterdam, Netherlands
Print_ISBN :
978-1-4673-4645-0
DOI :
10.1109/ESTC.2012.6542144