DocumentCode
2436363
Title
Integrated nano scale multilayer systems for reactive bonding in microsystems technology
Author
Braeuer, J. ; Besser, Jurgen ; Wiemer, M. ; Gessner, T.
Author_Institution
Fraunhofer Institute for Electronic Nano Systems (ENAS) Technologie-Campus 3, 09126 Chemnitz, Germany
fYear
2012
fDate
17-20 Sept. 2012
Firstpage
1
Lastpage
4
Abstract
This paper is presenting a metallic wafer bond process at room-temperature by using nano scale and integrated Pd/Al reactive multilayer systems. These systems are used as controllable and internal heat sources. By controlling the reaction properties of the systems strong and high yield wafer bonding of Si-Si, Si-glass as well as Si-ceramic without any significant defects is possible.
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic System-Integration Technology Conference (ESTC), 2012 4th
Conference_Location
Amsterdam, Netherlands
Print_ISBN
978-1-4673-4645-0
Type
conf
DOI
10.1109/ESTC.2012.6542144
Filename
6542144
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