• DocumentCode
    2436448
  • Title

    Nonlinear model of high electron mobility transistor

  • Author

    Yemtsev, P.A. ; Sunduchkov, I.K. ; Shelkovnikov, B.N. ; Sunduchkov, K.S.

  • Author_Institution
    Inst. of Telecommun., Nat. Tech. Univ. of Ukraine, Kyiv, Ukraine
  • fYear
    2003
  • fDate
    8-12 Sept. 2003
  • Firstpage
    216
  • Lastpage
    217
  • Abstract
    A new nonlinear HEMT model is presented. The model is based on a well-known small-signal model and includes a nonlinear description of some typically nonlinear components. A parameter extraction algorithm based on processing S-parameter and noise figure data measurements has been developed.
  • Keywords
    S-parameters; high electron mobility transistors; semiconductor device models; semiconductor device noise; HEMT; S-parameter; high electron mobility transistor; microwave applications; noise figure data measurement; parameter extraction algorithm; small-signal model; Circuit noise; HEMTs; Hidden Markov models; IEEE catalog; MODFETs; Noise figure; Noise measurement; Organizing; Parameter extraction; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology, 2003. CriMiCo 2003. 13th International Crimean Conference
  • Conference_Location
    Sevastopol, Crimea, Ukraine
  • Print_ISBN
    966-7968-26-X
  • Type

    conf

  • DOI
    10.1109/CRMICO.2003.158800
  • Filename
    1256485