A combined wavelet based mesh free method for solving the forward problem in electrical impedance tomography

In this paper, a combined wavelet based mesh free method is suggested to solve the forward problem in electrical impedance tomography (EIT). EIT is a noninvasive imaging modality based on the reconstruction of the conductivity profile inside a solution domain using injected low frequency currents and measuring voltage via electrodes. The forward problem simulates measurement data for comparing with experimental data in the inverse problem. Since the solution of the finite element method depends on the mesh shape and boundary condition constraints are difficult to apply in the mesh free method, the combined wavelet based mesh free method can resolve the disadvantages of these methods in the EIT forward problem. A two dimensional EIT problem is modeled. The simulation results obtained by the combined wavelet based mesh free method are compared with standard finite element method in terms of accuracy and computational cost.