DocumentCode :
2436811
Title :
A new scale adaptive wavelet thresholding method for denoising using chi-square test statistic
Author :
Das, A. ; Desai, U.B. ; Vaidya, P.P.
Author_Institution :
Electron. Div., Bhabha Atomic Res. Centre, Bombay, India
Volume :
3
fYear :
2002
fDate :
2002
Firstpage :
859
Abstract :
In this paper we develop a new scale adaptive scheme of wavelet thresholding for noise removal. The method uses chi-square test statistics (CTS) to discriminate between noise and signal among the wavelet coefficients. The scheme uses CTS as a ruler to measure the similarity between the statistical model and the true distribution of noise. The basic philosophy of the proposed method is similar to a recursive hypothesis testing procedure. We demonstrate this method by denoising signals corrupted with additive zero-mean Gaussian noise.
Keywords :
Gaussian noise; adaptive signal processing; interference suppression; signal denoising; statistical analysis; wavelet transforms; CTS; additive zero-mean Gaussian noise; chi-square test statistic; denoising; noise/signal discrimination; recursive hypothesis testing procedure; scale adaptive wavelet thresholding method; statistical model; true noise distribution/model similarity; wavelet coefficients; Additive noise; Gaussian noise; Image denoising; Length measurement; Noise measurement; Noise reduction; Statistical analysis; Testing; Wavelet coefficients; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN :
0-7803-7596-3
Type :
conf
DOI :
10.1109/ICECS.2002.1046383
Filename :
1046383
Link To Document :
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