• DocumentCode
    2437314
  • Title

    A radiation-hardened-by-design phase-locked loop using feedback voltage controlled oscillator

  • Author

    Seok Min Jung ; Roveda, Janet Meiling

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Arizona, Tucson, AZ, USA
  • fYear
    2015
  • fDate
    2-4 March 2015
  • Firstpage
    103
  • Lastpage
    106
  • Abstract
    This paper presents a radiation-hardened-by-design (RHBD) phase-locked loop (PLL) which utilizes a feedback voltage controlled oscillator (FBVCO) to mitigate a single event transient (SET) strike. Whenever the SET pulse attacks the input control voltage of VCO, VCO gives rise to a frequency disturbance and PLL produces a huge jitter at the output clock. The proposed FBVCO consists of an open loop VCO, an integrator and a switched-capacitor resistor. The input transfer function of the FBVCO has a low-pass characteristic so that the FBVCO can reduce any perturbation at the input control voltage. In addition, the proposed RHBD PLL reduces size by using one loop filter (LF) and charge pump (CP) compared to prior works. We simulate the proposed scheme in 130 nm low power CMOS technology at 1.5V supply. The output frequency variation of the proposed PLL from the SET strike is 75% smaller than that of previous PLL at 300 MHz. This RHBD PLL consumes 6.2 mW at 400 MHz output frequency.
  • Keywords
    CMOS integrated circuits; UHF oscillators; charge pump circuits; feedback oscillators; jitter; low-pass filters; low-power electronics; phase locked loops; radiation hardening (electronics); transfer functions; voltage control; voltage-controlled oscillators; CP; FBVCO; LF; RHBD PLL; SET pulse; charge pump; feedback voltage-controlled oscillator; frequency 400 MHz; frequency disturbance; frequency variation; input control voltage; input transfer function; integrators; jitter; loop filter; low power CMOS technology; low-pass characteristic; open loop VCO; output clock; perturbation reduction; phase locked loop; power 6.2 mW; radiation-hardened-by-design; single event transient strike mitigation; size 130 nm; size reduction; switched-capacitor resistor; voltage 1.5 V; CMOS integrated circuits; Computer architecture; Frequency control; Noise; Phase locked loops; Voltage control; Voltage-controlled oscillators; Phase-locked loop (PLL); loop filter (LF); radiation-hardened-by-design (RHBD); voltage controlled oscillator (VCO);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2015 16th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-7580-8
  • Type

    conf

  • DOI
    10.1109/ISQED.2015.7085407
  • Filename
    7085407