Title :
Test in the era of "What you see is not what you get" - Keynote address
Abstract :
Provides an abstract of the keynote presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
Keywords :
Design engineering; Engineering management; Failure analysis; Manufacturing processes; Process design; Semiconductor device manufacture; Semiconductor device testing; Software debugging; Software testing; System testing;
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
0-7803-8580-2
DOI :
10.1109/TEST.2004.1386929
