DocumentCode :
2437801
Title :
Carbon Nanotube Based Memory Development and Testing
Author :
Smith, R.F. ; Rueckes, T. ; Konsek, S. ; Ward, J.W. ; Brock, D.K. ; Segal, B.M.
Author_Institution :
Nantero Inc., Woburn
fYear :
2007
fDate :
3-10 March 2007
Firstpage :
1
Lastpage :
5
Abstract :
Manufacturability of most electronic devices based on carbon nanotubes depends on the ability to place, manipulate, and control individual structures at the molecular level. This approach is problematic due to the precise placement and registration required thus making large scale manufacturing difficult if not impossible. A novel technique has been developed to overcome this hurdle, allowing CNT based nano-devices to be fabricated directly on existing production CMOS fabrication lines. This technique has been demonstrated in a Class 1 commercial fab and enables the fabrication of CNT nonvolatile memory devices directly onto CMOS substrates. This unique approach relies on the deposition and lithographic patterning, using standard semiconductor toolsets, of a 1-2 nm thick fabric of carbon nanotubes which retain their molecular scale, electro-mechanical characteristics, even when patterned to less than 100 nm feature sizes. The non-volatile CNT switch is turned on using electrostatic forces and remains in the ON state through van der Waals (VDW) attraction. The switch is turned off by overcoming the VDW forces and creating separation of the tubes from a contact.
Keywords :
CMOS memory circuits; carbon nanotubes; integrated circuit testing; random-access storage; CMOS fabrication lines; CMOS substrates; CNT based nanodevices; CNT nonvolatile memory devices; Class 1 commercial fab; carbon nanotube; electro-mechanical characteristics; electronic devices; electrostatic forces; large scale manufacturing; lithographic patterning; manufacturability; memory development; memory testing; nanotechnology; nonvolatile CNT switch; van der Waals attraction; Carbon nanotubes; Fabrication; Fabrics; Large-scale systems; Manufacturing; Nonvolatile memory; Production; Substrates; Switches; Testing; CNT; Carbon Nanotubes; component; electro-mechanical devices; nanotechnology; non-volatile memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 2007 IEEE
Conference_Location :
Big Sky, MT
ISSN :
1095-323X
Print_ISBN :
1-4244-0524-6
Electronic_ISBN :
1095-323X
Type :
conf
DOI :
10.1109/AERO.2007.353104
Filename :
4161514
Link To Document :
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