• DocumentCode
    2437801
  • Title

    Carbon Nanotube Based Memory Development and Testing

  • Author

    Smith, R.F. ; Rueckes, T. ; Konsek, S. ; Ward, J.W. ; Brock, D.K. ; Segal, B.M.

  • Author_Institution
    Nantero Inc., Woburn
  • fYear
    2007
  • fDate
    3-10 March 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Manufacturability of most electronic devices based on carbon nanotubes depends on the ability to place, manipulate, and control individual structures at the molecular level. This approach is problematic due to the precise placement and registration required thus making large scale manufacturing difficult if not impossible. A novel technique has been developed to overcome this hurdle, allowing CNT based nano-devices to be fabricated directly on existing production CMOS fabrication lines. This technique has been demonstrated in a Class 1 commercial fab and enables the fabrication of CNT nonvolatile memory devices directly onto CMOS substrates. This unique approach relies on the deposition and lithographic patterning, using standard semiconductor toolsets, of a 1-2 nm thick fabric of carbon nanotubes which retain their molecular scale, electro-mechanical characteristics, even when patterned to less than 100 nm feature sizes. The non-volatile CNT switch is turned on using electrostatic forces and remains in the ON state through van der Waals (VDW) attraction. The switch is turned off by overcoming the VDW forces and creating separation of the tubes from a contact.
  • Keywords
    CMOS memory circuits; carbon nanotubes; integrated circuit testing; random-access storage; CMOS fabrication lines; CMOS substrates; CNT based nanodevices; CNT nonvolatile memory devices; Class 1 commercial fab; carbon nanotube; electro-mechanical characteristics; electronic devices; electrostatic forces; large scale manufacturing; lithographic patterning; manufacturability; memory development; memory testing; nanotechnology; nonvolatile CNT switch; van der Waals attraction; Carbon nanotubes; Fabrication; Fabrics; Large-scale systems; Manufacturing; Nonvolatile memory; Production; Substrates; Switches; Testing; CNT; Carbon Nanotubes; component; electro-mechanical devices; nanotechnology; non-volatile memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2007 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    1-4244-0524-6
  • Electronic_ISBN
    1095-323X
  • Type

    conf

  • DOI
    10.1109/AERO.2007.353104
  • Filename
    4161514