DocumentCode
2437816
Title
Error exponents in multiple hypothesis testing for arbitrarily varying sources
Author
Grigoryan, Naira M. ; Harutyunyan, Ashot N.
fYear
2010
fDate
Aug. 30 2010-Sept. 3 2010
Firstpage
1
Lastpage
5
Abstract
The problem of multiple hypothesis testing (HT) for arbitrarily varying sources (AVS) is considered. The achievable error probability exponents (reliabilities) region is derived, optimal decision schemes are described. The result extends the known ones by Fu and Shen and by Tuncel. The Chernoff bounds for AVS binary and M-ary HT are specified via indication of a Sanov theorem for those sources.
Keywords
probability; statistical testing; AVS binary; Chernoff bounds; M-ary HT; achievable error probability exponents; arbitrarily varying sources; error exponents; multiple hypothesis testing; optimal decision schemes; Computer aided software engineering; Error probability; Information theory; Reliability theory; Testing; Tin; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory Workshop (ITW), 2010 IEEE
Conference_Location
Dublin
Print_ISBN
978-1-4244-8262-7
Electronic_ISBN
978-1-4244-8263-4
Type
conf
DOI
10.1109/CIG.2010.5592740
Filename
5592740
Link To Document