Title :
Reliability Modeling and Simulation Discussion Group
Author :
Rosenbaum, Elyse ; Shenai, Krishna
Keywords :
Calibration; Capacitance; Circuit simulation; Circuit testing; Hot carriers; Integrated circuit reliability; Materials reliability; Predictive models; Stress; Timing;
Conference_Titel :
Integrated Reliability Workshop, 1994. Final Report., 1994 International
Print_ISBN :
0-7803-1908-7
DOI :
10.1109/IRWS.1994.515843
