• DocumentCode
    2437892
  • Title

    Reliability Modeling and Simulation Discussion Group

  • Author

    Rosenbaum, Elyse ; Shenai, Krishna

  • fYear
    1994
  • fDate
    16-19 Oct 1994
  • Firstpage
    143
  • Keywords
    Calibration; Capacitance; Circuit simulation; Circuit testing; Hot carriers; Integrated circuit reliability; Materials reliability; Predictive models; Stress; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop, 1994. Final Report., 1994 International
  • Print_ISBN
    0-7803-1908-7
  • Type

    conf

  • DOI
    10.1109/IRWS.1994.515843
  • Filename
    515843
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2437892