DocumentCode

243795

Title

The following topics are dealt with: variation-aware and low-power design; hardware security and testing; advanced circuit for computing; memristive and 3-dimensional designs; biomedical and sensor circuits; variability and aging of integrated circuits; memory and oscillator circuits; test generation and fault diagnosis; CAD for verification, debugging, digital systems, memory technologies, power integrity and partitioning technique; CMOS devices; subpower circuit and 3D architecture; FinFET and optical technology based design; dynamic power management; security and error tolerance in system architecture; VLSI and network-on-a-chip based systems; secure and trustworthy embedded systems; high-reliability design; soft error analysis and mitigation.

Keywords

CAD; CMOS integrated circuits; MOSFET; VLSI; biomedical electronics; fault diagnosis; integrated circuit design; integrated circuit reliability; integrated circuit testing; integrated memory circuits; low-power electronics; memristors; network-on-chip; oscillators; radiation hardening (electronics); sensors; three-dimensional integrated circuits; 3-dimensional designs; 3D system architecture; CAD; CMOS devices; FinFET; VLSI; advanced computing circuit; biomedical sensor circuits; debugging; digital systems; dynamic power management; error tolerance; fault diagnosis; hardware security; hardware testing; high-reliability design; integrated circuit aging; low-power design; memory circuits; memristive designs; mitigation; network-on-a-chip; optical technology based design; oscillator circuits; partitioning technique; power integrity; soft error analysis; subpower circuit; test generation; trustworthy embedded systems; variation-aware design; verification;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI (ISVLSI), 2014 IEEE Computer Society Annual Symposium on

Conference_Location

Tampa, FL

Print_ISBN

978-1-4799-3763-9

Type

conf

DOI

10.1109/ISVLSI.2014.8

Filename

6903319

Table of contents

conf