A real-time jitter measurement board for high-performance computer and communication systems

Author

Yamaguchi, Takahiro J. ; Ishida, Masahiro ; Soma, Mani ; Ichiyama, Kiyotaka ; Christian, Krawinkel ; Ohsawa, Katsuaki ; Sugai, Masao

Author_Institution

Advantest Lab. Ltd., Sendai, Japan

fYear

2004

fDate

26-28 Oct. 2004

Firstpage

77

Lastpage

84

Abstract

This work presents the design and performance results of a real-time jitter measurement board for testing high-frequency clocks and data transceivers. The board targets high-volume manufacturing test to measure sinusoidal jitter tolerance and random jitter in computer and communication systems, with a substantial reduction in test cost compared to existing equipment. The board meets jitter tolerance and random jitter measurement needs and is suitable for production testing.

Keywords

cost reduction; digital communication; production testing; timing jitter; transceivers; cost reduction; data transceivers; high frequency clocks; high performance communication systems; high performance computer systems; high volume manufacturing test; production testing; random jitter; real time jitter measurement board; sinusoidal jitter tolerance; Circuit testing; Clocks; Computer aided manufacturing; Costs; Electric variables measurement; Frequency measurement; Instruments; Real time systems; System testing; Timing jitter;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2004. Proceedings. ITC 2004. International

Print_ISBN

0-7803-8580-2

Type

conf

DOI

10.1109/TEST.2004.1386939

Filename

1386939