Experimental results for high-speed jitter measurement technique

Author

Taylor, Karen ; Nelson, Bryan ; Chong, Alan ; Nguyen, Hieu ; Lin, Henry ; Soma, Mani ; Haggag, Hosam ; Huard, Jeff ; Braatz, Jim

Author_Institution

Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA

fYear

2004

fDate

26-28 Oct. 2004

Firstpage

85

Lastpage

94

Abstract

A BIST method to measure jitter without external references is presented. Measured data from 0.25- m BiCMOS chips show jitter resolution about 30 to 50 ps over 8 cycles of a 1 GHz input signal. The measurement technique uses the clock signal under test to control the charging of the input capacitance of an ADC. One advantage of this design is that it does not require an external jitter-free reference clock or a voltage reference. Design improvements from architectures to circuits are discussed and the method has potentials in other timing measurement applications.

Keywords

BiCMOS integrated circuits; CMOS integrated circuits; built-in self test; high-speed techniques; integrated circuit design; integrated circuit testing; jitter; 1 GHz; 30 to 50 ps; ADC; BIST method; BiCMOS chips; clock signal; external jitter-free reference clock; high speed jitter measurement technique; jitter resolution; BiCMOS integrated circuits; Built-in self-test; Capacitance; Circuit testing; Clocks; Jitter; Measurement techniques; Semiconductor device measurement; Signal resolution; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2004. Proceedings. ITC 2004. International

Print_ISBN

0-7803-8580-2

Type

conf

DOI

10.1109/TEST.2004.1386940

Filename

1386940