DocumentCode :
2438266
Title :
ATE data collection - a comprehensive requirements proposal to maximize ROI of test
Author :
Rehani, Manu ; Abercrombie, David ; Madge, Robert ; Teisher, Jim ; Saw, Jason
Author_Institution :
LSI Logic Corp., Milpitas, CA, USA
fYear :
2004
fDate :
26-28 Oct. 2004
Firstpage :
181
Lastpage :
189
Abstract :
ATE customers are increasingly viewing a tester that does not facilitate easy and consistent access to the test data as a barrier to their profitability. The data is needed towards various ends like, statistical post processing (SPP) for die binning, reliability improvement, burn-in elimination, process/yield improvement, adaptive control, product characterization, test floor statistical process control (SPC), calibration & test repeatability to name a few. subcontractor & foundry manufacturing have only increased the complexity of the task. The main premise of This work is that: "Taking the measurement" is the ATE vendor\´s expertise, "Evaluating the measurement" is the customer\´s expertise and we have a proposal to clear the confusion and maximize the ROI of test. The paper discusses the current "state-of-the-art " in terms of data collection, illustrates the windfall of benefits reaped from utilizing the ATE data and presents a proposal on how to improve the situation.
Keywords :
automatic test equipment; ATE customers; ATE data collection; ATE vendor; ROI maximization; adaptive control; burn-in elimination; die binning; measurement evaluation; process yield improvement; product characterization; profitability; reliability; state of the art technology; statistical post processing; test floor statistical process control; Adaptive control; Automatic testing; Calibration; Large scale integration; Logic testing; Process control; Profitability; Proposals; Statistical analysis; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
Type :
conf
DOI :
10.1109/TEST.2004.1386951
Filename :
1386951
Link To Document :
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